Improving grain yield, stress resilience and quality of bread wheat using large-scale genomics

First author: Philomin Juliana; Affiliations: International Maize And Wheat Improvement Center (国际玉米小麦改良中心): Texcoco, Mexico

Corresponding author: Ravi Prakash Singh

Bread wheat improvement using genomic tools is essential for accelerating trait genetic gains. Here we report the genomic predictabilities of 35 key traits and demonstrate the potential of genomic selection for wheat end-use quality. We also performed a large genome-wide association study that identified several significant marker–trait associations for 50 traits evaluated in South Asia, Africa and the Americas. Furthermore, we built a reference wheat genotype–phenotype map, explored allele frequency dynamics over time and fingerprinted 44,624 wheat lines for trait-associated markers, generating over 7.6 million data points, which together will provide a valuable resource to the wheat community for enhancing productivity and stress resilience.

利用基因组工具进行面包小麦的遗传改良有助于加速目的性状的遗传增益。本文中，作者报道了35个关键性状的基因组可预测性，展示了基因组选择对于小麦品质提升的应用潜力。作者同时还进行了一个大范围的全基因组关联分析，鉴定了50个在南亚、非洲和美国评估的性状的显著标记-性状关联。此外，作者构建了一个小麦遗传-表型参考图谱，探究了等位基因频率随着时间的动态变化，构建了44624份小麦品系性状相关标记的指纹图谱，产生了超过7.6百万个数据点，这些数据为小麦群体提高生产力和抗逆性提供了以一个珍贵的遗传资源。

通讯：Ravi Prakash Singh  (https://www.cimmyt.org/people/ravi-singh/)

个人简介：1977年，贝拿勒斯印度教大学，学士；1979年，贝拿勒斯印度教大学，硕士；1983年，澳大利亚悉尼大学，博士。

研究方向：小麦遗传改良。

doi: https://doi.org/10.1038/s41588-019-0496-6

Journal: Nature Genetics

Published date: September 23, 2019