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TIMS (Thermal Ionization Mass Spectrometry) and MC-ICP-MS (Multiple Collector Inductively Coupled Plasma Mass Spectrometry):
Parameter | Thermal Ionization Mass Spectrometry (TIMS) | Multiple Collector Inductively Coupled Plasma Mass Spectrometry (MC-ICP-MS) |
---|---|---|
Principle | Heating samples to ionize elements, typically using a filament or resistive film | Ionization of elements by a high-temperature plasma generated by an inductively coupled plasma torch |
Main Application | Precise radiometric dating (e.g., U-Pb, Rb-Sr, Sm-Nd) and high-precision stable isotope analysis | Rapid and high-throughput stable isotope ratio analysis, particularly for trace elements |
Spatial Resolution | Limited, generally not suitable for micro-sampling | Can be coupled with LA (Laser Ablation) for micro-spatial analysis (LA-MC-ICP-MS) |
Elemental Range | Limited to specific elements that form volatile oxides or chlorides | Wider range, applicable to a larger number of elements |
Sensitivity | Exceptionally high for certain elements due to longer counting times | Good sensitivity for trace elements, though generally lower than TIMS |
Analysis Time | Longer, typically suited for fewer samples with high precision demands | Shorter, allowing for high sample throughput and rapid results |
Matrix Effects | More pronounced due to direct sample loading | Less sensitive to matrix effects but still influenced by them |
Sample Preparation | Requires chemical separation and loading onto filaments or targets | Generally less complex, can handle solutions and solids directly |
Typical Precision | Outstanding for long-lived radioactive isotopes and select stable isotopes | Excellent for many stable isotopes, though depends on instrument configuration |
Cost Per Analysis | Higher due to specialized consumables and longer run times | Lower for routine analyses, but initial instrument cost can be higher |
Sample Consumption | Relatively high, particularly for isotopic dating methods | Low, suited for small samples or precious materials |
Note: This table summarizes general information, and specific details might vary depending on the instrument model, configuration, and the laboratory setup.
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