13. X射线衍射(XRD)结果表明,不同温度下(20~350 ℃)生长的ZnO薄膜具有纤锌矿结构,并且呈c轴择优取向。[译]The X-ray diffraction (XRD) results showed the ZnO films deposited under different temperature (20~350 ℃) were with wurtzite structure and highly c-axis oriented.[评] under diff ...
6. 采用失调量而非g因子作为参数,直接给出稳定区范围和失调误差,使用性好。[译]By adopting off-focus amount instead of factor g as the parameter, the stable region boundary and maladjusted error are derived directly, which is simple, straightforward and convenience for applicatio ...