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Mantrach, Amin; Yen, Luh; Callut, Jerome; Francoisse, Kevin; Shimbo, Masashi; Saerens, Marco;
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Volume: 32 , Issue: 6
Digital Object Identifier: 10.1109/TPAMI.2009.78
Publication Year: 2010 , Page(s): 1112 - 1126
IEEE Journals
Abstract | Full Text: PDF (2167 KB)
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