图3. 在三维结构的鳍形硅基底上异质外延的2H-MoTe2薄膜的截面扫描透射电镜表征。 合作团队观察到通过相变的平面内二维外延技术不受晶格匹配和平整表面的限制,因此允许在任意基底上合成大面积单晶2H-MoTe2薄膜。通过将2H-MoTe2薄膜与1英寸Si晶圆集成,合作团队制备了垂直p-n异质结阵列,该阵列表现出 100% 的器件良率、高器件性能和优异的均匀性(图4)。合作团队的方法为二维半导体2H-MoTe2薄膜与其他基底的异质集成提供了可能性。 图4. 晶圆级别的2H-MoTe2/Si异质pn结器件与伏安特性表征。 相关研究成果以“Heteroepitaxy of semiconducting 2H-MoTe2 thin films on arbitrary surfaces for large-scale heterogeneous integration”为题发表于《自然·合成》(Nature synthesis)。同期加州大学洛杉矶分校的段镶锋、黄昱教授团队在Nature Synthesis上撰写题为“Any surface will do (任何表面都可以)”的评论文章介绍我们工作的研究价值和创新意义。北京大学博士研究生潘宇、中国科学院大学博士后Roger Guzman为共同第一作者;北京大学陈基研究员、中国科学院大学周武教授、北京大学博雅博士后徐晓龙(现为北京理工大学预聘教授)和北京大学叶堉研究员为共同通讯作者。 上述研究工作得到国家重点研发计划、国家自然科学基金、北京市自然科学基金、北京大学长三角光电科学,以及人工微结构和介观物理国家重点实验室等支持。
Roger Guzman,PhD, Special research assistant (2019-now),School of Physics, University of Chinese Academy of Sciences.
Graduated in Materials Science and Technology by the Autonomous University of Barcelona (2014, Barcelona), my scientific portfolio covers analytical electron microscopy techniques development and fundamental material physics research of strongly-correlated complex oxides such as superconductors, magnetic complex-oxides, multiferroics, and more recently two-dimensional (2D) materials. I have been trained in experimental aberration corrected scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS). My goal has been to establish a synergistically combined microscopy and materials science physics research at the frontier of analytical electron spectroscopy, establishing relations between the structure, chemistry and physical properties of low-dimensional systems such as in heterostructures, interfaces and defects, down to the single-atom level. My current research projects are devoted to the development and implementation of state-of-the-art STEM analytical tools for the study of low dimensional systems, such as four-dimensional STEM and vibrational electron-energy loss (EELS).