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Neighborhood Repulsed Metric Learning for Kinship Verification
Lu, J. ; Zhou, X. ; Tan, Y. ; Shang, Y. ; Zhou, J.
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Volume: PP , Issue:99
Digital Object Identifier: 10.1109/TPAMI.2013.134
Publication Year: 2013 , Page(s): 1
Neighborhood Repulsed Metric Learning:近邻变形距离测度 8.10.pdf
Neighborhood Repulsed Metric Learning:近邻变形距离测度_RED 8.11.doc
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