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Liu Yang; Rong Jin; Mummert, L.; Sukthankar, R.; Goode, A.; Bin Zheng; Hoi, S.C.H.; Satyanarayanan, M.;
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Volume: 32 , Issue: 1
Digital Object Identifier: 10.1109/TPAMI.2008.273
Publication Year: 2010 , Page(s): 30 - 44
IEEE Journals
Abstract | Full Text: PDF (2770 KB)
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